Lex

Browse

GenresShelvesPremiumBlog

Company

AboutJobsPartnersSell on LexAffiliates

Resources

DocsInvite FriendsFAQ

Legal

Terms of ServicePrivacy Policygeneral@lex-books.com(215) 703-8277

© 2026 LexBooks, Inc. All rights reserved.

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry1995

W. Murray Bullis

Details

First published
1995
OL Work ID
OL3655402W

Subjects

SemiconductorsOptical methodsTestingSemiconductor industryCharacterization

Find this book

Open Library
Book data from Open Library. Cover images courtesy of Open Library.