W
W. Murray Bullis
1930
7 works on record
Works

Semiconductor characterization
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry
1995
Semiconductor measurement technology
Semiconductor measurement technology
1993
Evolution of silicon materials characterization
Evolution of silicon materials characterization
1993
Metrology for submicrometer devices and circuits
Metrology for submicrometer devices and circuits
1980
Measurement methods for the semiconductor device industry - a summary of NBS activity
Measurement methods for the semiconductor device industry - a summary of NBS activity
1969
Measurement of carrier lifetime in semiconductors
Measurement of carrier lifetime in semiconductors
1968