Lex

Browse

GenresShelvesPremiumBlog

Company

AboutJobsPartnersSell on LexAffiliates

Resources

DocsInvite FriendsFAQ

Legal

Terms of ServicePrivacy Policygeneral@lex-books.com(215) 703-8277

© 2026 LexBooks, Inc. All rights reserved.

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Manoj Sachdev, Andrei Pavlov

2.0(2)on Goodreads

Details

OL Work ID
OL25615555W

Subjects

Metal oxide semiconductors, complementaryComputer storage devicesElectronics

Find this book

GoodreadsOpen Library
Book data from Open Library. Cover images courtesy of Open Library.