M
Manoj Sachdev
6 works on record
Works
Defect oriented testing for CMOS analog and digital circuits
1998
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
Defect-oriented testing for nano-metric CMOS VLSI circuits
2000 IEEE International Workshop on Defect Based Testing
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies