Michael T. Postek
17 works on record
Works
Microlithography and metrology in micromachining II
Microlithography and metrology in micromachining
Nanostructure science, metrology, and technology
Integrated Circuit Metrology, Inspection, and Process Control VI
Integrated Circuit Metrology, Inspection, And Process Control VII
Critical Issues in Scanning Electron Microscope Metrology
Instrumentation, metrology, and standards for nanomanufacturing II
Instrumentation, metrology, and standards for nanomanufacturing III
Scanning microscopy 2009
Scanning microscopy 2010
New research in nanotechnology
Instrumentation, metrology, and standards for nanomanufacturing IV
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V
Scanning electron microscopy
Scanning Microscopies 2015
Scanning Microscopies 2012
Scanning microscopies 2011