Michael T. Postek
17 works on record
Works

Microlithography and metrology in micromachining II

Microlithography and metrology in micromachining

Nanostructure science, metrology, and technology

Integrated Circuit Metrology, Inspection, and Process Control VI

Integrated Circuit Metrology, Inspection, And Process Control VII

Critical Issues in Scanning Electron Microscope Metrology
Instrumentation, metrology, and standards for nanomanufacturing II
Instrumentation, metrology, and standards for nanomanufacturing III
Scanning microscopy 2009
Scanning microscopy 2010
New research in nanotechnology
Instrumentation, metrology, and standards for nanomanufacturing IV
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V
Scanning electron microscopy
Scanning Microscopies 2015
Scanning Microscopies 2012
Scanning microscopies 2011