Lex

Browse

GenresShelvesPremiumBlog

Company

AboutJobsPartnersSell on LexAffiliates

Resources

DocsInvite FriendsFAQ

Legal

Terms of ServicePrivacy Policygeneral@lex-books.com(215) 703-8277

© 2026 LexBooks, Inc. All rights reserved.

IEEE conference record

IEEE conference record

Argonne National Laboratory, Symposium on Feature Extraction and Selection in Pattern Recognition (1970 Argonne National Laboratory), Institute of Electrical and Electronics Engineers

Details

OL Work ID
OL44632999W

Subjects

Pattern perceptionCongresses

Find this book

Open Library
Book data from Open Library. Cover images courtesy of Open Library.