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Probability of detection of internal voids in structural ceramics using microfocus radiography

Probability of detection of internal voids in structural ceramics using microfocus radiography1985

George Y. Baaklini

Details

First published
1985
OL Work ID
OL11147972W

Subjects

Silicon nitrideSilicon carbideRadiographyStatistical analysisCeramic materialsSinteringVoidsCeramics

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