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Imaging and illumination for metrology and inspectionImaging and illumination for metrology and inspection

Imaging and illumination for metrology and inspection

Donald J. Svetkoff

Details

OL Work ID
OL18984326W

Subjects

Optical detectorsComputer visionInterferometryCongressesThree-dimensional imagingThree-dimensional display systems

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Book data from Open Library. Cover images courtesy of Open Library.