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Auger electron spetroscopy, secondary ion mass spectrometry and optical characterization of a-C:H and BN films

Auger electron spetroscopy, secondary ion mass spectrometry and optical characterization of a-C:H and BN films

John J. Pouch

Details

OL Work ID
OL8857001W

Subjects

Amorphous materialsAmorphous semiconductorsBoron nitrideBoron nitridesCarbonDielectricsPlasma diodesSemiconductor devices

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