Charge loss modeling for EPROMs with ONO interpoly dielectric
Charge loss modeling for EPROMs with ONO interpoly dielectric1994
About this book
"The investigations presented in this work identify the origin of intrinsic long term charge loss in EPROMs with ONO interploy dielectric and model the charge transport through the ONO dielectric as a function of electric field and temperature"--Abstract.
Details
- First published
- 1994
- OL Work ID
- OL3041833W
Subjects
Computer storage devicesCharge transferMicroelectronicsDielectric loss