Optical characterization techniques for high-performance microelectronic device manufacturing
Optical characterization techniques for high-performance microelectronic device manufacturing
About this book
vii, 202 p. : 28 cm
Details
- OL Work ID
- OL23536567W
Subjects
Optical methodsCongressesOptical pattern recognitionSemiconductorsTestingIntegrated circuitsDesign and constructionSemiconductors -- Design and construction -- CongressesIntegrated circuits -- Design and construction -- CongressesSemiconductors -- Testing -- Optical methods -- CongressesIntegrated circuits -- Testing -- Optical methods -- CongressesOptical pattern recognition -- Congresses