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Testing, reliability, and application of micro- and nano-material systemsTesting, reliability, and application of micro- and nano-material systems

Testing, reliability, and application of micro- and nano-material systems

Norbert Meyendorf, George Y. Baaklini

Details

OL Work ID
OL19039293W

Subjects

Microelectromechanical systemsMaterialsCongressesNanostructured materialsPhotonicsTestingElectrooptical devices

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Book data from Open Library. Cover images courtesy of Open Library.