Biometric Quality : the Last 1%
Biometric Quality : the Last 1%2008
Patrick Grother, Elham Tabassi, U. S. Department of Commerce National Institute of Standards and Technology (NIST)
Details
- First published
- 2008
- OL Work ID
- OL40394156W
Patrick Grother, Elham Tabassi, U. S. Department of Commerce National Institute of Standards and Technology (NIST)