Characterization of Microstructures by Analytical Electron Microscopy (AEM)
Characterization of Microstructures by Analytical Electron Microscopy (AEM)2012
Details
- First published
- 2012
- OL Work ID
- OL32220848W
Subjects
Materials scienceSurfaces (Physics)Characterization and Evaluation of MaterialsCondensed Matter PhysicsOptics, Optoelectronics, Plasmonics and Optical Devices