Lex

Browse

GenresShelvesPremiumBlog

Company

AboutJobsPartnersSell on LexAffiliates

Resources

DocsInvite FriendsFAQ

Legal

Terms of ServicePrivacy Policygeneral@lex-books.com(215) 703-8277

© 2026 LexBooks, Inc. All rights reserved.

Materials Reliability in Microelectronics IIMaterials Reliability in Microelectronics II

Materials Reliability in Microelectronics II

C. V. Thompson

Details

OL Work ID
OL8856973W

Subjects

MicroelectronicsMaterials, researchDiffusionReliabilityCongressesMaterialsTestingElectrodiffusionMicrostructure

Find this book

Open Library
Book data from Open Library. Cover images courtesy of Open Library.