Lex

Browse

GenresShelvesPremiumBlog

Company

AboutJobsPartnersSell on LexAffiliates

Resources

DocsInvite FriendsFAQ

Legal

Terms of ServicePrivacy Policygeneral@lex-books.com(215) 703-8277

© 2026 LexBooks, Inc. All rights reserved.

Optical characterization techniques for high-performance microelectronic device manufacturing IIOptical characterization techniques for high-performance microelectronic device manufacturing II

Optical characterization techniques for high-performance microelectronic device manufacturing II

Ray T. Chen, John Lowell

Details

OL Work ID
OL23574755W

Subjects

SemiconductorsTestingManufacturing processesDesign and constructionOptical methodsCongressesOptical detectorsIntegrated circuits industryIntegrated circuitsOptical pattern recognition

Find this book

Open Library
Book data from Open Library. Cover images courtesy of Open Library.