Lex

Browse

GenresShelvesPremiumBlog

Company

AboutJobsPartnersSell on LexAffiliates

Resources

DocsInvite FriendsFAQ

Legal

Terms of ServicePrivacy Policygeneral@lex-books.com(215) 703-8277

© 2026 LexBooks, Inc. All rights reserved.

Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)

Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)

M. J. Howes, D. V. Morgan

Details

OL Work ID
OL19334245W

Subjects

SemiconductorsReliabilitySolid state electronicsIntegrated circuits

Find this book

Open Library
Book data from Open Library. Cover images courtesy of Open Library.