Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99
Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '991999
IEEE Reliability Society, IEEE Components Packaging & Manufacturin, IEEE Electron Devices Society, International Symposium on the Physical & Failure Analysis of Integrated Circuits (7th 1999 Singapore)
Details
- First published
- 1999
- OL Work ID
- OL13498139W
Subjects
CongressesIntegrated circuitsTestingDefectsElectronics - Circuits - GeneralTechnology & Industrial Arts