Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
Details
- OL Work ID
- OL9266679W
Subjects
Silicon crystalsDefectsSemiconductorsDiffusionOptoelectronics