Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices
Defects and Synchrotron X-Ray Topography in Silicone-Carbide Based Devices
Ulrike Grossner
,
Gregor Pobegen
,
Juraj Marek
Details
OL Work ID
OL36044684W
Subjects
Mechanical engineering
Materials
Electronics
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