IEEE International Workshop on IDDQ Testing
IEEE International Workshop on IDDQ Testing1997
Anura P. Jayasumana, IEEE International Workshop on IDDQ Testing (3rd 1997 Washington, D.C.), D. C.) IEEE International Workshop on IDDQ Testing (3rd : 1997 : Washington
Details
- First published
- 1997
- OL Work ID
- OL2769314W
Subjects
Complementary Metal oxide semiconductorsCongressesIddq testingMetal oxide semiconductors, ComplementaryTestingGeneral Theory of ComputingStorage media & peripheralsDigital Computer HardwareComputersTechnology & Industrial ArtsScience/MathematicsGeneralLogic DesignComputer EngineeringMetal oxide semiconductors, Co