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Testing For Smalldelay Defects In Nanoscale Cmos Integrated CircuitsTesting For Smalldelay Defects In Nanoscale Cmos Integrated Circuits

Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits

Sandeep K. Goel, Krishnendu Chakrabarty

Details

OL Work ID
OL17390418W

Subjects

Metal oxide semiconductors, complementaryNanotechnologyComplementary Metal oxide semiconductorsTestingMOS complémentairesEssaisTECHNOLOGY & ENGINEERINGMechanical

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