Lex

Browse

GenresShelvesPremiumBlog

Company

AboutJobsPartnersSell on LexAffiliates

Resources

DocsInvite FriendsFAQ

Legal

Terms of ServicePrivacy Policygeneral@lex-books.com(215) 703-8277

© 2026 LexBooks, Inc. All rights reserved.

Machine vision systems for inspection and metrology VIIIMachine vision systems for inspection and metrology VIII

Machine vision systems for inspection and metrology VIII

Bruce G. Batchelor

Details

OL Work ID
OL19394562W

Subjects

Computer visionCongressesOptical measurementsEngineering inspectionIndustrial applicationsAutomation

Find this book

Open Library
Book data from Open Library. Cover images courtesy of Open Library.