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Two- and Three-dimensional Methods for Inspection and MetrologyTwo- and Three-dimensional Methods for Inspection and Metrology

Two- and Three-dimensional Methods for Inspection and Metrology

Peisen S. Huang

Details

OL Work ID
OL9620957W

Subjects

MetrologyImaging systemsOptical methodsComputer visionQuality controlCongressesOptical measurementsThree-dimensional display systems

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Book data from Open Library. Cover images courtesy of Open Library.