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Two- and three-dimensional vision systems for inspection, control, and metrologyTwo- and three-dimensional vision systems for inspection, control, and metrology

Two- and three-dimensional vision systems for inspection, control, and metrology

Bruce G. Batchelor

Details

OL Work ID
OL18930503W

Subjects

Optical pattern recognition systemsMetrologyImaging systemsOptical methodsComputer visionQuality controlCongressesOptical measurementsThree-dimensional display systemsImage processingOptical detectorsOptical pattern recognition

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