Two- and three-dimensional vision systems for inspection, control, and metrology

Two- and three-dimensional vision systems for inspection, control, and metrology
Details
- OL Work ID
- OL18930503W
Subjects
Optical pattern recognition systemsMetrologyImaging systemsOptical methodsComputer visionQuality controlCongressesOptical measurementsThree-dimensional display systemsImage processingOptical detectorsOptical pattern recognition