D
David G. Seiler
9 works on record
Works

Semiconductor characterization

Life on Hold

Characterization and metrology for ULSI technology, 2000
Narrow-gap semiconductors and related materials
Narrow-gap semiconductors and related materials
Characterization and metrology for ULSI technology
Characterization and metrology for ULSI technology
Semiconductors and semimetals
Semiconductors and semimetals
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites
Spectroscopy of Semiconductors
Spectroscopy of Semiconductors
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics