F
Fred H. Pollak
8 works on record
Works
Spectroscopic characterization techniques for semiconductor technology II
Layered structures
Spectroscopic charcterization techniques for semiconductor technology
Surface and interface analysis of microelectronic materials processing and growth
Spectroscopic characterization techniques for semiconductor technology III
Modern optical characterization techniques for semiconductors and semiconductor devices
Diagnostic Techniques for Semiconductor Materials Processing II Vol. 406
Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions
Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions