C
Cher Ming Tan
8 works on record
Works

Electromigration Modeling at Circuit Layout Level

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Theory and Practice of Quality and Reliability Engineering in Asia Industry

Reliability and Failure Analysis of High Power LED Packaging

Reliability Analysis of Electrotechnical Devices
Graphene and VLSI Interconnects
Graphene and VLSI Interconnects
Graphene and Ulsi Interconnects
Graphene and Ulsi Interconnects
Electromigration in Ulsi Interconnections
Electromigration in Ulsi Interconnections